SAT-based Formal Verification of Fault Injection Countermeasures for Cryptographic Circuits

Authors

  • Huiyu Tan ShanghaiTech University, Shanghai 201210, China; Wingsemi Technology Co., Ltd., Shanghai 201203, China
  • Pengfei Gao Bytedance, Beijing 100098, China
  • Fu Song Key Laboratory of System Software (Chinese Academy of Sciences) and State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing 100190, China; Nanjing Institute of Software Technology, Nanjing 211135, China
  • Taolue Chen Birkbeck, University of London, WC1E 7HX, UK
  • Zhilin Wu Key Laboratory of System Software (Chinese Academy of Sciences) and State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing 100190, China

DOI:

https://doi.org/10.46586/tches.v2024.i4.1-39

Keywords:

Fault Injection, Cryptographic Circuits, SAT, Formal Verification

Abstract

Fault injection attacks represent a type of active, physical attack against cryptographic circuits. Various countermeasures have been proposed to thwart such attacks, however, the design and implementation of which are intricate, error-prone, and laborious. The current formal fault-resistance verification approaches are limited in efficiency and scalability. In this paper, we formalize the fault-resistance verification problem and show that it is coNP-complete. We then devise a novel approach for encoding the fault-resistance verification problem as the Boolean satisfiability (SAT) problem so that modern off-the-shelf SAT solvers can be utilized. The approach is implemented in an open-source tool FIRMER which is evaluated extensively on realistic cryptographic circuit benchmarks. The experimental results show that FIRMER is able to verify fault-resistance of almost all (72/76) benchmarks in 3 minutes (the other three are verified in 35 minutes and the hardest one is verified in 4 hours). In contrast, the prior approach fails on 31 fault-resistance verification tasks even after 24 hours (per task).

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Published

2024-09-05

Issue

Section

Articles

How to Cite

SAT-based Formal Verification of Fault Injection Countermeasures for Cryptographic Circuits. (2024). IACR Transactions on Cryptographic Hardware and Embedded Systems, 2024(4), 1-39. https://doi.org/10.46586/tches.v2024.i4.1-39